Sub-grain orientation resolution during continuous loading using only far-field HEDM
نویسندگان
چکیده
منابع مشابه
Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly focused fields.
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ژورنال
عنوان ژورنال: IOP Conference Series: Materials Science and Engineering
سال: 2019
ISSN: 1757-899X
DOI: 10.1088/1757-899x/580/1/012018